RF Generator CDG 7000 | Immunity | 10 kHz - 400 MHz

Induced RF

IEC / EN 61000-4-6
IEC 60601-1-2 Ed. 4.1 / IEC 61000-4-39
MIL-STD-461 CS114
ISO 11452-4
IEC 61326-3-2
NAMUR

Are you an installer or operator of plants, systems or devices? Then you are certainly familiar with the EMC problems that occur when powerful assemblies with high interference emissions and highly sensitive electronics are operated in close proximity to each other. Here it is important to investigate the existing interference potential. This concerns interference voltages, interference currents, interference field strengths and magnetic fields. For electromagnetic interference fields according to IEC 61000-4-6 and IEC 61000-4-39 or IEC 60601-1-2, it is best to use our CDG 7000 combination device.

The CDG 7000 is a new test generator for all standards for immunity to conducted disturbances and magnetic fields induced by radio-frequency fields, such as IEC 61000-4-6  - including BCI tests (ISO 11452-4). The CDG 7000 generates interferences as defined in IEC / EN 61000-4-6 - immunity to conducted disturbances  induced by radio-frequency fields. The standard describes a test setup in which these high-frequency interferences can be influenced on a EUT without a complicated structure with antennas, field instrumentation and shielded rooms. By using coupling networks and coupling clamp's sine waves are induced directly into power and signal lines. The test object retains its original place in the device structure, so that the system can be tested in its overall function.

The versatile combination device includes 

  • an RF signal generator, an RF power amplifier, a 3-channel RF voltmeter and a directional coupler. 

The test generator CDG 7000-75-10 in combination with our test sets is suitable for tests according to IEC 60601-1-2 Ed. 4.1 and IEC 61000-4-39.

The CDG 7000-E is another device that does not contain an internal RF power amplifier to allow customers to use flexible external amplifiers.

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  • Top price / performance ratio!
  • The compact device consists of an RF signal generator, an RF power amplifier, a 3-channel RF voltmeter and a directional coupler
  • Frequency range (signal generator) 4 kHz - 1200 MHz
  • The RF generator for conducted and magnetic field tests is available in four different versions:

    - CDG 7000-25: 100 kHz - 250 MHz, amplifier 25 W
    Maximum test level: 10 V (15 V) with 80 % AM (without 6 dB)
    Built-in directional coupler (200 W, 100 kHz - 500 MHz), with HELIA 7 - Basic USB, LAN software

    - CDG 7000-75: 100 kHz - 400 MHz, amplifier 75 W
    Maximum test level: 30 V (40 V) with 80 % AM (without 6 dB)
    Built-in directional coupler (200 W, 100 kHz - 500 MHz), with HELIA 7 - Basic USB, LAN software

    - CDG 7000-75-10: 10 kHz - 250 MHz, amplifier 75 W
    Maximum test level: 30 V (40 V) with 80 % AM (without 6 dB)
    Built-in directional coupler (200 W, 10 kHz - 400 MHz) with HELIA 7 - Basic USB, LAN software

    - CDG 7000-E: Frequency range of the generator/power meter (4 kHz):
    9 kHz - 1200 MHz, no integrated amplifier
    Built-in directional coupler (200 W - optionally up to 500 W, 10 kHz - 1 GHz) with HELIA 7 - Basic USB, LAN software

  • The included application software (HELIA 7 - Basic) enables extensive reporting functions and EUT monitoring, (HELIA 7 - BCI required for BCI testing)
  • Simple expansion with external amplifier via 2nd generator output
  • SCPI command set enables easy integration into own software systems
  • Interfaces: USB, LAN, GPIB (option)
  • Temperature measuring input, e.g. for monitoring and displaying the BCI clamp temperature
  • Input for external pulse modulation
  • Configurable, digital 8-channel user port
  • Warranty 3 years

We provide the test system from the factory with "Helia 7", an uncomplicated application software. This enables extensive reporting functions, as well as EUT monitoring. In addition, the package includes a self-test. And last but not least, you have the possibility to initiate automatic test sequences based on different standards. You can also use the "Direct Mode" to subject the EUT to further different tests. Integration into your own software systems is easy thanks to the integrated SCPI command set. If you want to perform additional BCI tests, the Helia-7 BCI software is available as an option. We have developed this program to enable you to control, analyze and document BCI tests. At Schlöder, service is a top priority. You therefore receive a three-year manufacturer's warranty and can contact customer service at any time if you have any questions.

The testing of installations, systems and devices is carried out in accordance with standard IEC / EN 61000-4-6. The interference signals are fed into the lines in different ways. The following figure shows an example of a basic test setup for a single EUT with connected accessories (AE) via a coupling/decoupling network:

RF Generator - CDG 7000

1 Insulation, 10 cm ±5 cm
2 Ground plate as reference
3 Test cable
4 Connection cable

T    Terminating resistor
T2  Attenuator
L1  Distance 10 - 30 cm
h    min. 3 cm

In order to comply with the IEC / EN 61000-4-6 standard, the CDNs must be calibrated before use. To calibrate the coupling devices (CDNs or EM coupling path), they must be mounted on a ground plate in accordance with the standard.

EMC tests are used to characterise the electromagnetic compatibility of electronic or electrotechnical products or devices. EMC immunity testing involves analysing immunity to external interference. Measuring electromagnetic immunity is a sub-area of EMC testing. It generally deals with the determination of interference emissions.

The use of EMC measurement technology is an effective way to optimize the immunity of modern digital technology. The reasons for this development include inadequately solved EMC problems and the high cost pressure in the use of electronic components.

Immunity to interference describes the degree of a system's ability to continue to operate without functional failure or malfunction, as well as unaffected by an interference quantity that has a defined and targeted effect on the device under test.