Immunity, 10 kHz - 400 MHz
Induced RF, 10 kHz - 400 MHz
IEC 60601-1-2 Ed. 4.1 / IEC 61000-4-39
Are you an installer or operator of plants, systems or devices? Then you are certainly familiar with the EMC problems that occur when powerful assemblies with high interference emissions and highly sensitive electronics are operated in close proximity to each other. Here it is important to investigate the existing interference potential. This concerns interference voltages, interference currents, interference field strengths and magnetic fields. For electromagnetic interference fields according to IEC 61000-4-6 and IEC 61000-4-39 or IEC 60601-1-2, it is best to use our CDG 7000 combination device.
The CDG 7000 is a new test generator for all standards for immunity to conducted disturbances and magnetic fields induced by radio-frequency fields, such as IEC 61000-4-6 - including BCI tests (ISO 11452-4). The CDG 7000 generates interferences as defined in IEC / EN 61000-4-6 - immunity to conducted disturbances induced by radio-frequency fields. The standard describes a test setup in which these high-frequency interferences can be influenced on a EUT without a complicated structure with antennas, field instrumentation and shielded rooms. By using coupling networks and coupling clamp's sine waves are induced directly into power and signal lines. The test object retains its original place in the device structure, so that the system can be tested in its overall function.
The versatile combination device includes
- an RF signal generator, an RF power amplifier, a 3-channel RF voltmeter and a directional coupler.
The test generator CDG 7000-75-10 in combination with our test sets is suitable for tests according to IEC 60601-1-2 Ed. 4.1 and IEC 61000-4-39.
The CDG 7000-E is another device that does not contain an internal RF power amplifier to allow customers to use flexible external amplifiers.
- Top price / performance ratio!
- The compact device consists of an RF signal generator, an RF power amplifier, a 3-channel RF voltmeter and a directional coupler
- Frequency range (signal generator) 4 kHz - 1200 MHz
- The RF power amplifier is available in three different models
- The included application software (HELIA 7 - Basic) enables extensive reporting functions and EUT monitoring, (HELIA 7 - BCI required for BCI testing)
- Simple expansion with external amplifier via 2nd generator output
- SCPI command set enables easy integration into own software systems
- Interfaces: USB, LAN, GPIB (option)
- Temperature measuring input, e.g. for monitoring and displaying the BCI clamp temperature
- Input for external pulse modulation
- Configurable, digital 8-channel user port
- Warranty 3 years
We provide the test system from the factory with "Helia 7", an uncomplicated application software. This enables extensive reporting functions, as well as EUT monitoring. In addition, the package includes a self-test. And last but not least, you have the possibility to initiate automatic test sequences based on different standards. You can also use the "Direct Mode" to subject the EUT to further different tests. Integration into your own software systems is easy thanks to the integrated SCPI command set. If you want to perform additional BCI tests, the Helia-7 BCI software is available as an option. We have developed this program to enable you to control, analyze and document BCI tests. At Schlöder, service is a top priority. You therefore receive a three-year manufacturer's warranty and can contact customer service at any time if you have any questions.
The testing of equipment, systems and devices is carried out in accordance with the EN 61000-4-6 standard. The interference pulse is galvanically coupled on the supply lines. On the signal lines, which are more than two meters long, capacitive coupling is performed using a coupling clamp. The test voltage is specified either by the basic technical standard or a product standard.
EMC tests serve the purpose of characterizing electronic or electrotechnical products or devices for their electromagnetic compatibility. EMC immunity testing includes the study of immunity to external disturbances. Measuring electromagnetic immunity is a subfield of EMC testing. It is usually concerned with the determination of interference emissions.
The use of EMC measurement technology is an effective way to optimize the immunity of modern digital technology. The reasons for this development include inadequately solved EMC problems and the high cost pressure in the use of electronic components.
Immunity to interference describes the degree of a system's ability to continue to operate without functional failure or malfunction, as well as unaffected by an interference quantity that has a defined and targeted effect on the device under test.